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美國(guó)Park Systems?
Park Systems公司擁有20多年原子力顯微鏡生產(chǎn)技術(shù)積累，是從事該行業(yè)歷史最長(zhǎng)的公司。XE系列原子力顯微鏡是Park Systems公司多年研究的成果。在原子力產(chǎn)品中傾注了多年的Know-How技術(shù)，生產(chǎn)出了具有前所未有的測(cè)量學(xué)性能的真正的下一代原子力顯微鏡。它徹底解決了基于壓電陶瓷管的AFM產(chǎn)生的非線性和非正交所帶來(lái)的問題。
Park Systems無(wú)論在科研還是在工業(yè)領(lǐng)域都是納米尺度測(cè)量及系統(tǒng)的技術(shù)領(lǐng)導(dǎo)者。公司的產(chǎn)品線反映了在納米測(cè)量應(yīng)用方面的強(qiáng)大實(shí)力。
公司以全面的產(chǎn)品、軟件、服務(wù)和專家?guī)椭脩臬@取所需的測(cè)量性能，可以滿足現(xiàn)在和未來(lái)的需求。
The root of Park Systems can be found at Stanford University, the birthplace of Atomic Force Microscope (AFM). Dr. Sang-il Park, Chairman and CEO of Park Systems, and Dr. Sung Park, VP and General Manager of the US Headquarters, were graduate students of applied physics at the university, working in the very group that invented the AFM. Later they became the original founders of Park Scientific Instruments and developed the world’s first commercial AFM in 1989.

The spin-off company (PSIA) was renamed Park Systems in 2007. After 20 years of continuous growth, Park Systems has developed global sales network over 26 countries and the company currently has more than 700 customers of its new product line, the XE-series, around the world.

Park Systems serves its customers worldwide with advanced atomic force microscopes and global service and support with direct offices in Korea, Japan, Singapore, and the United States. For over 25 years, Park Systems has developed a reputation as the AFM technology leader and preferred nanotechnology solutions partner for demanding nanoscale research and industrial measurements, among major universities, research institutes and industry leaders who demand the very best precision metrology solutions for the most challenging problems in their fields.

1989 : The World's First Commercial AFM (Park Scientific Instruments)
1992 : Closed-Loop Scanner (Park Scientific Instruments)
2002 : Crosstalk Eliminated (XE) AFM for Flat and Linear XY Scan
2004 : True Non-Contact Mode for Non-destructive Sample Scan
2008 : XE-3DM, New 3D AFM for High Resolution 3D Metrology
2009 : XE-Bio, New Bio AFM for Live Cell Imaging with Ion Conductance Microscopy (ICM)