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德國FOCUS GmbH
FOCUS 公司成立于1990 年，從事電子分光儀和表面分析儀器的開發(fā)與生產(chǎn)。大部分FOCUS產(chǎn)品由位于德國Taunusstein 市的OMICRON 公司在全球經(jīng)銷。
產(chǎn)品系列包括常規(guī)表面分析儀，如電子分光計(jì)和超真空紫外光源。除用于制備納米級結(jié)構(gòu)的蒸發(fā)器之外，F(xiàn)OCUS 公司還開發(fā)了一種納米分析儀－ FOCUS PEEM。 它是一種緊湊型光電顯微鏡，用于各種表面的電子光學(xué)成像，分辨率可達(dá)40 納米。該儀器的性能可通過選用能量過濾器得到加強(qiáng)。能量過濾器為能量選擇PEEM 成像（光譜顯微鏡）和局部能量分布光譜（顯微分光鏡）提供了方便的方法。PEEM Nano-ESCA 系統(tǒng)即是一個(gè)高性能的能量過濾器。目前，該儀器正在進(jìn)一步開發(fā)中，以便為納米分析科學(xué)提供標(biāo)準(zhǔn)。該儀器一方面提高了橫向分辨率，另一方面，除了傳統(tǒng)的表面分析科學(xué)和表面磁性法之外，該儀器又開辟了一個(gè)新的應(yīng)用領(lǐng)域。兼容型樣本轉(zhuǎn)移系統(tǒng)保障了PEEM 以及其它諸如STM（掃描隧道顯微鏡）/ AFM（原子力顯微鏡）之類的納米分析儀器的應(yīng)用。PEEM 可以用于檢查納米級工作函數(shù)的對比、磁性表面域和化合
物的橫向分布。
FOCUS-SPLEED 是一種用于電子自旋分析的專利產(chǎn)品，配合一個(gè)掃描電子顯微鏡使用可以實(shí)現(xiàn)納米級磁疇成像(SEMPA)。
Since the foundation in 1990, the company FOCUS GmbH is engaged in the development
and creation of instruments for electron spectroscopy and surface analysis. The main part of
the FOCUS products is distributed all over the world by the company OMICRON GmbH in
Taunusstein/Germany.
The product range includes usual surface science instruments like electron spectrometers
and VUV-light sources. Beside the evaporators, which are used for the preparation of
nanoscaled structures, FOCUS has developed a nanoanalytic instrument, the FOCUS PEEM.
It is a compact photoelectron microscope, which is used for the electron optical mapping
of surfaces down to the resolution range of 40 nm. The instrument can be enhanced by an
optional energy filter, which introduce simple methods for energy selective PEEM imaging
(spectromicroscopy) and spectra of local energy distribution (microspectroscopy). A high
performance filter is invented as the PEEM Nano-ESCA system. The instrument is at present
under further development to allocate a standard for nanoanalytic and science. On the one
hand stands the enhancement of the lateral resolution, on the other hand there is the opening of
a new application range beside the classical surface science and magnetism. The application
of the PEEM together with other nanoanalytic instruments like STM/AFM is warranted by
compatible sample transfer systems. The PEEM can be used for visualisation of nanoscaled
workfunction contrast, magnetic surface domains and lateral distribution of compounds.
The patented instrument FOCUS-SPLEED, a detector for spin analysis of electrons, enables
together with a scanning electron microscope the imaging of nanoscaled magnetic domains
(SEMPA).
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總部
FOCUS GmbH
Neukircher Stra?e 2
D-65510 Hünstetten-Kesselbach