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美國(guó)IXRF Systems
IXRF公司位于美國(guó)德克薩斯州，是一家專業(yè)的微量分析儀器生產(chǎn)廠家。公司擁有齊全的EDS產(chǎn)品，先進(jìn)的EDS軟件包；并且，IXRF公司還開創(chuàng)性地將小型XRF管延伸到SEM領(lǐng)域，使用戶能在SEM中對(duì)樣品進(jìn)行XRF分析，實(shí)現(xiàn)EDS分析和XRF分析的互補(bǔ)。

IXRF Systems was incorporated on October 1st, 1993 in the state of Texas. The company originally began by upgrading Kevex bulk X-ray Fluorescence systems to modern Windows-based systems. It is from these XRF beginnings that the name IXRF is derived. IXRF quickly expanded its product offerings to include Microanalysis systems. Today, Microanalysis systems make up the majority of IXRF's business; however adding XRF (X-ray Fluorescence) has been accepted rapidly, coining the phrase "iXRF" meaning "Integrated XRF" in the SEM.

IXRF's current products include 

• Complete new EDS systems - IXRF provides complete EDS systems, including new detectors.

• EDS System Upgrades - Using an existing EDS detector, older EDS systems can be upgraded to state-of-the-art systems for a much lower cost than that of new systems.

• fX SEM Tube - Provides a 500 micron to 5mm X-ray spot (XRF) analysis in the SEM.

• X-Beam - State-of-the-Art Micro XRF. Spot Sizes around 40-60 microns or larger.

• Custom X-ray Applications - IXRF develops specialty products for a variety of customers. Customized Analytical software, Stage Automation, and product development.

Advantages

• High Performance Features, offered as a Standard, not Options

• State-of-the-Art Electronics Design

• Excellent Service and Support (3 year warranty on hardware; 1 year warranty on new EDS detectors)

• Free Software Updates (for the life of the system, for the original purchaser)

Product History

• 2010: Major new version of application software released, Iridium Ultra, which is Windows 7-compliant

• 2009: High speed piezo stage for any SEM chamber "Super Stage", allows very fast XRF stage scans for mapping

• 2008: IXRF software is Vista-compliant, X-ray map transparency capability, ability to quantify EDS spectra from variable
              pressure SEM

• 2007: Release of the 550i converts the IXRF interface electronics to Ethernet and can be used on any PC on the
              SEM/STEM/TEM, eliminating the need for a second computer

• 2006: XRF successfully combines EDS and XRF into a single Quantitative Routine, adds RoboStage, Image Stitching,
              X-ray Map Stitching

• 2005: X-Beam produces XRF 10-40 micron X-ray maps and is configured for automated particle analysis

• 2004: IXRF releases first ever combined EDS/XRF quantitative analysis

• 2003: IXRF completes Third fully integrated EDS system for TESCAN Digital Microscopy

• 2002: IXRF mounts the first XRF tube on a SEM, making the first fully-integrated XRF & EDS microanalysis within the SEM

• 2001: IXRF completes Particle Analysis on the Integrated JEOL Ltd product line

• 2000: IXRF completes the Second fully integrated EDS system, this time for JEOL Ltd product line

• 1999: IXRF designs a new hardware interface allowing the use of Oxford PentaFET detectors for upgrading existing EDS
              customers

• 1999: IXRF completes “Particle Scan” offering the first truly integrated Particle Analysis within the operating system of the
              SEM (developed for LEO Electron Microscopy)

• 1998: Jetscan Engine Health Monitor wins a millennium award from the British government (developed for LEO Electron
              Microscopy)

• 1997: IXRF completes the First 100% Integrated EDS Microanalysis system in history (developed for  LEO Electron
              Microscopy)

• 1995: Digital Imaging, Feature Analysis, and X-Ray Mapping are added to the standard software

• 1993: Los Alamos National Lab receives the first IXRF system

About the People

The people involved with IXRF have been designing and manufacturing x-ray instrumentation for over 33 years.
 

Per Sjoman, CEO IXRF Systems, Inc.
CEO and Hardware Designer, since 1993 inception
Background
Kevex Instruments, Senior Electronics Engineer (designer of Sesame and Sigma hardware), 19 years
 

Rich Lamb, VP IXRF Systems, Inc.
VP and Software Development, since 1993 inception
Background
Topometrix, Senior Programmer, 3 years
Kevex Instruments, Senior Programmer XRF and Microanalysis, 12 years
 

Brian Cross, Ph.D., Owner CrossRoads Scientific
IXRF Systems, Inc., Senior Scientist/Software Programmer/Consultant, since 1993 inception
Background
Kevex, Senior Scientist (including Software Manager for Sigma Microanalysis system design), 10 years
Tracor Northern (Noran), 2 years
Link Analytical (Oxford Instruments), 4 years
 

Bernie Ware, Imaging Specialist IXRF Systems, Inc.
IXRF Systems, Inc., Imaging Specialist (new and old SEMs), since 1993 inception
Background
Kevex Instruments, Senior Imaging Engineer, (Sesame and current Sigma hardware), 21 years
 

Kenny Witherspoon, VP Marketing IXRF Systems, Inc.
IXRF Systems, Inc., VP Marketing, since 1993 inception
Background
Kevex Instruments, Installation/Applications and Technical Support Engineer. (Customer service and Marketing), 5 years.

Larry Kolodziejski, Applications Specialist IXRF Systems, Inc.
IXRF Systems, Inc., Installation/Training Specialist, since 2008
Background
Analytical Solutions Inc., SEM Lab Manager, 11 years
Gatan, Marketing Manager, 2 years
Kevex Instruments, Software Development & Technical Support Engineer, 3 years
JEOL USA Inc., TEM Applications Specialist, 9 years
 

Jim Fontinopoulos, Installation/Applications and Technical Support Engineer, since 1999

Melissa Raneiri, Account Manager, since 2005

Tabitha Guardion, Administration/Reception, since 2010