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現(xiàn)在位置首頁>光學儀器>電子顯微鏡> 掃描電子顯微鏡(SEM)

德國ZEISS蔡司聚焦離子束掃描電鏡FIB/SEM

價  格:詢價

產(chǎn)  地:更新時間:2021-01-18 15:00

品  牌:型  號:Crossbeam 350,Crossbeam 550

狀  態(tài):正常點擊量:2130

400-006-7520
聯(lián)系我時,請說明是在上海非利加實業(yè)有限公司上看到的,謝謝!

上海非利加實業(yè)有限公司

聯(lián) 系 人: 上海非利加實業(yè)有限公司

電   話: 400-006-7520

傳   真: 400-006-7520

配送方式: 上海自提或三方快遞

聯(lián)系我時請說在上海非利加實業(yè)有限公司上看到的,謝謝!



 德***ZEISS蔡司聚焦離子束掃描電鏡FIB/SEM

 

   

 

在蔡司Crossbeam系列中,您可選擇Crossbeam 350或者Crossbeam 550,來滿足您急需的表征應用,您還可選擇不同的樣品倉尺寸從而更好的兼容您的樣品。

 

 

 

In the Zeiss Crossbeam series, you can choose Crossbeam 350 or Crossbeam 550 to meet your urgent need for characterization applications, and you can also choose a different sample chamber size for better compatibility with your samples.

 

Zeiss Crossbeam 350

Scanning electron beam system Gemini I cylinder

Variable pressure option

Sample bin size and interface the standard sample bin has 18 extension ports

The X/Y travel of the sample table is 100mm

Charge control charge neutralization gun

Local charge neutralizer

Variable pressure

Optional: Inlens SE and Inlens EsB* probes capture both SE and EsB imaging

VPSE detector

 

 

Features a wide range of sample compatibility due to the use of variable pressure mode, suitable for all kinds of in-situ experiments, which can obtain SE/EsB images in turn



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